mtd_oobtest fails with GPMI-NAND

[Stefan Roese]

On 05/13/2013 11:34 AM, Huang Shijie wrote:
> 于 2013年05月13日 17:22, Stefan Roese 写道:
>> Done. But no errors in this test though. Even with increasing the
>> cycles_count. I don't want to destroy this chip, so I'm not increasing
>> the cycles too much.
> If you can pass the bonnie++ stress test on the ubifs, it means the gpmi 
> works fine.

Do you have any specific parameters that I should use for this test?

>> Which NAND devices did you test with on imx6? Did you also tests with a
>> "similar" Micron ONFI chip as this one (MT29F4G08ABADAH4)?
>>
> For micron's chips, I tested more then 10 chips. some chips show following :
> Micron MT29F4G08ABADAWP (2048 + 64)
> 
> Micron MT29F8G08ABACAWP (4096 + 224)
> 
> Micron MT29F4G08ABAEAWP (4096 + 224)
> 
> Micron MT29F32G08QAA (4096 + 218)

Thank for this update.

> But i do not test your chip. I do not have this chip, if i have, i can 
> test it on arm2/ard boards.

Sure. Thanks anyways for all your input.

Thanks,
Stefan