mtd_oobtest fails with GPMI-NAND

[Huang Shijie]

于 2013年05月13日 17:22, Stefan Roese 写道:
> Done. But no errors in this test though. Even with increasing the
> cycles_count. I don't want to destroy this chip, so I'm not increasing
> the cycles too much.
If you can pass the bonnie++ stress test on the ubifs, it means the gpmi 
works fine.

> Which NAND devices did you test with on imx6? Did you also tests with a
> "similar" Micron ONFI chip as this one (MT29F4G08ABADAH4)?
>
For micron's chips, I tested more then 10 chips. some chips show following :
Micron MT29F4G08ABADAWP (2048 + 64)

Micron MT29F8G08ABACAWP (4096 + 224)

Micron MT29F4G08ABAEAWP (4096 + 224)

Micron MT29F32G08QAA (4096 + 218)


But i do not test your chip. I do not have this chip, if i have, i can 
test it on arm2/ard boards.


thanks
Huang Shijie