[PATCH 4/5] mtd: nand: add support for Micron on-die ECC

[Boris Brezillon]

Hi Bean,

On Wed, 22 Mar 2017 13:20:04 +0000
"Bean Huo (beanhuo)" <beanhuo at micron.com> wrote:

> >+micron_nand_read_page_on_die_ecc(struct mtd_info *mtd, struct nand_chip
> >*chip,
> >+                                                         uint8_t *buf, int oob_required,
> >+                                                         int page)
> >+{
> >+             int status;
> >+             int max_bitflips = 0;
> >+
> >+             micron_nand_on_die_ecc_setup(chip, true);
> >+
> >+             chip->cmdfunc(mtd, NAND_CMD_READ0, 0x00, page);
> >+             chip->cmdfunc(mtd, NAND_CMD_STATUS, -1, -1);
> >+             status = chip->read_byte(mtd);
> >+             if (status & NAND_STATUS_FAIL)
> >+                           mtd->ecc_stats.failed++;
> >+             /*
> >+             * The internal ECC doesn't tell us the number of bitflips
> >+             * that have been corrected, but tells us if it recommends to
> >+             * rewrite the block. If it's the case, then we pretend we had
> >+             * a number of bitflips equal to the ECC strength, which will
> >+             * hint the NAND core to rewrite the block.
> >+             */
> >+             else if (status & NAND_STATUS_WRITE_RECOMMENDED)
> >+                           max_bitflips = chip->ecc.strength;
> >+
> >+             chip->cmdfunc(mtd, NAND_CMD_READ0, -1, -1);
> >+
> >+             nand_read_page_raw(mtd, chip, buf, oob_required, page);
> >+
> >+             micron_nand_on_die_ecc_setup(chip, false);
> >+
> >+             return max_bitflips;
> >+}  
> 
> 
> Hi, 
> Let me give you some information, hopefully you can do some modification based on above codes.
> 
> I noticed that this patches are based on MT29F1G08ABADAWP SLC NAND, it is our 60s 34nm SLC NAND.
> So far, we have 2 series SLC NAND with implementations of on die ECC.
> 1. M79A for all 25nm (70series) SLC NAND with on-die ECC (M78A, M79A, and future design M70A)
> 2. M60A for all 34nm (60series) SLC NAND with on-die ECC

Do you have an easy way to differentiate those 2 generations of chip,
or should we base our detection on the model name provided in the ONFI
parameter page?

> 
> NAND_STATUS_FAIL:
> For the both of series SLC NAND with on-die ECC, SR bit 0 (NAND_STATUS_FAIL) indicates an uncorrectable read fail,
> data is lost, no recovery possible, unless we have software additional protection, the block is not necessarily
> bad but the data is lost.
> 
> NAND_STATUS_WRITE_RECOMMENDED:
> 
> For the NAND_STATUS_WRITE_RECOMMENDED, it only works on 60s NAND, it is 4 bit ECC, the status register only
> indicates if there is 0 or 1-4 correctable error bits. We don't want to trigger refresh if only 1 or 2 bits fail.
> the base refresh is that if there 3 or 4 bitflips. But unfortunately we can't get failed bit count trough read status register. 
> SW workaround proposal:
> 1. If SR bit 3 is set to 1 it means 1~4 bitflips and correctable.
> 2. Read out the page with ECC ON
> 3. Read out the page with ECC OFF
> 4. Compare the data
> 5. Count the number of bitflips for the sectors (there are 4 ECC sectors)
> 6. if 3 or more fail bits, trigger fresh. 
> I know this is not good solution, but if as long as NAND_STATUS_WRITE_RECOMMENDED is set, and trigger refresh,
> this will definitely increase NAND PE cycle.

We discussed that with Thomas when developing the solution. I suggested
to first go for a simple solution even if it implies unneeded PE
cycles when bitflips are detected, but maybe I was wrong. In any case,
it shouldn't be to hard to do what you suggest.

> 
> For the 70s, it is 8 bits on-die ECC, the status register can report 7-8 bitflips (refresh recommended), 4-6 bitflips and 1-3 bitflips.
> So we can trigger refresh according to its bitflips status.

That's good news!

Thanks for your feedback.

Boris