[PATCH 0/4 v3] mtd: onenand: samsung: Simplify code and fix leaks in error handling paths

Boris Brezillon boris.brezillon at free-electrons.com
Mon Dec 18 12:03:32 PST 2017


On Thu, 14 Dec 2017 07:03:48 +0100
Christophe JAILLET <christophe.jaillet at wanadoo.fr> wrote:

> The first patch converts 's3c_onenand_probe()' to devm_ functions.
> This fixes a leak in one path (line 872).
> This also free_irq which was not handled at all. ( I hope I'm correct :) )
> 
> The 2nd patch is about an un-handled error code which looks spurious.
> Not sure if I'm right.
> 
> The 3rd patch propagates an error code instead of returning a hard-coded
> value.
> 
> The last one removes a useless include spotted while compile-testing.
> 
> 
> v3: patch 1/4 updated to fix a bug introduced in v2
>     patch 2/4 unchanged
>     patch 3/4 and 4/4 added
>     now the patch are cross-compile tested :)
> 
> Theses patches have been cross compile-tested-only.

Applied the whole series.

Thanks,

Boris

> 
> Christophe JAILLET (4):
>   mtd: onenand: samsung: use devm_ function to simplify
>     code and fix some leaks
>   mtd: onenand: samsung: return an error if 
>     'mtd_device_parse_register()' fails
>   mtd: onenand: samsung: Propagate the error returned
>     by 'onenand_scan()'
>   mtd: onenand: samsung: Remove a useless include
> 
>  drivers/mtd/onenand/samsung.c | 172 +++++++++---------------------------------
>  1 file changed, 35 insertions(+), 137 deletions(-)
> 




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