[PATCH] mtd: Add config option to skip scanning bad blocks in partitions

[Daniel Ehrenberg]

On Fri, Jan 16, 2015 at 10:53 AM, Ricard Wanderlof
<ricard.wanderlof at axis.com> wrote:
>
> On Fri, 16 Jan 2015, Daniel Ehrenberg wrote:
>
> Are you and Erik Ekman on this list working on the same thing, he is also
> using an out-of-tree NAND driver?

No, I'm not working with him.

> The conclusion as far as I'm concerned is to use a BBT in a production
> code so that the flash is only ever read in its entirety (i.e. with
> badblocks) once, in order to generate the BBT. In our R&D department,
> especially in departments where they just want a unit to work and aren't
> testing or developing flash code, we can be more leniant and have even
> erased factory-marked bad blocks in some cases (when possible). In the
> unlikely event that a memory chip starts behaving erratically (which
> hasn't happened yet) we'd just replace it. In the field such a situation
> would be harder to diagnose so we want to avoid that as far as possible.

Thanks for this explanation. I'll work on adding a bad block table to
how I'm using NAND. I don't know what got into my head to think that
UBI was going to do all this for me. I guess the original patch at the
head of this thread isn't so useful for that use case.

Dan