[PATCH v2] mtd: torturetest: add the support for random data pattern

[Huang Shijie]

于 2013年02月05日 17:48, Ricard Wanderlof 写道:
>
> On Tue, 5 Feb 2013, Huang Shijie wrote:
>
>> Add a new module parameter 'pattern'. The meaning of the pattern is:
>> (1) pattern == 0 for 55/AA pattern.
>> (2) pattern < 0 for random pattern.
>> (3) pattern > 0 for random pattern too, the value of the pattern is used
>> as the seed for the random generator.
>>
>> Signed-off-by: Huang Shijie <b32955 at freescale.com>
>> ...
>> +static int pattern;
>> +module_param(pattern, int, S_IRUGO);
>> +MODULE_PARM_DESC(pattern, "0 for 55/AA pattern(default);"
>> + "less then 0 for random pattern;"
>> + "greater then 0 for random too, "
>> + "the value of the pattern is the seed.");
> ^^^^^^^^ parameter ?
ok, thanks.

Huang Shijie
>
> /Ricard