[PATCH v4 6/6] mtd: update the ABI document about the ecc step size
Brian Norris
computersforpeace at gmail.com
Sat Aug 17 14:14:47 EDT 2013
On Fri, Aug 16, 2013 at 11:26:47PM -0400, Huang Shijie wrote:
> On Fri, Aug 16, 2013 at 04:45:59PM +0300, Artem Bityutskiy wrote:
> > On Fri, 2013-08-16 at 10:10 +0800, Huang Shijie wrote:
> > > +
> > > +What: /sys/class/mtd/mtdX/ecc_step_size
> > > +Date: May 2013
> > > +KernelVersion: 3.10
> > > +Contact: linux-mtd at lists.infradead.org
> > > +Description:
> > > + The size of each ECC step which is used for ECC.
> > > + Note that some devices will have multiple ecc steps within each
> > > + writesize region.
> >
> > Actually this phrase is a bit confusing because it may be interpreted as
> > that one write-size may have ECC steps of multiple sizes. Would you
> > re-phrase, may be?
> What's about the following:
> -----------------------------------------------------------------
> The size of each ECC step which is used for ECC.
> Note that some devices will have multiple ecc steps within each
> writesize region, and the ecc steps share the same size.
> -----------------------------------------------------------------
I took pieces of your message and rewrote it myself. Diff pasted below
(I edited ecc_strength to be less redundant and added a few details that
were worth mentioning). Let me know if you want to revise it, but I'll
push it to l2-mtd.git.
Brian
---
Documentation/ABI/testing/sysfs-class-mtd | 18 +++++++++++++++---
1 file changed, 15 insertions(+), 3 deletions(-)
diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd
index 3105644..a795582 100644
--- a/Documentation/ABI/testing/sysfs-class-mtd
+++ b/Documentation/ABI/testing/sysfs-class-mtd
@@ -128,9 +128,8 @@ KernelVersion: 3.4
Contact: linux-mtd at lists.infradead.org
Description:
Maximum number of bit errors that the device is capable of
- correcting within each region covering an ecc step. This will
- always be a non-negative integer. Note that some devices will
- have multiple ecc steps within each writesize region.
+ correcting within each region covering an ECC step (see
+ ecc_step_size). This will always be a non-negative integer.
In the case of devices lacking any ECC capability, it is 0.
@@ -173,3 +172,16 @@ Description:
This is generally applicable only to NAND flash devices with ECC
capability. It is ignored on devices lacking ECC capability;
i.e., devices for which ecc_strength is zero.
+
+What: /sys/class/mtd/mtdX/ecc_step_size
+Date: May 2013
+KernelVersion: 3.10
+Contact: linux-mtd at lists.infradead.org
+Description:
+ The size of a single region covered by ECC, known as the ECC
+ step. Devices may have several equally sized ECC steps within
+ each writesize region. The step size counts only the data area,
+ not the spare area.
+
+ It will always be a non-negative integer. In the case of
+ devices lacking any ECC capability, it is 0.
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