[PATCH v4 6/6] mtd: update the ABI document about the ecc step size
b32955 at freescale.com
Thu Aug 15 22:10:09 EDT 2013
We add a new sys node for ecc step size. So update the ABI document about it.
Signed-off-by: Huang Shijie <b32955 at freescale.com>
Documentation/ABI/testing/sysfs-class-mtd | 10 ++++++++++
1 files changed, 10 insertions(+), 0 deletions(-)
diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd
index 3105644..da112ab 100644
@@ -173,3 +173,13 @@ Description:
This is generally applicable only to NAND flash devices with ECC
capability. It is ignored on devices lacking ECC capability;
i.e., devices for which ecc_strength is zero.
+Date: May 2013
+Contact: linux-mtd at lists.infradead.org
+ The size of each ECC step which is used for ECC.
+ Note that some devices will have multiple ecc steps within each
+ writesize region. See more in the ecc_strength above. This will
+ always be a non-negative integer.
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