[PATCH v4 6/6] mtd: update the ABI document about the ecc step size

[Huang Shijie]

We add a new sys node for ecc step size. So update the ABI document about it.

Signed-off-by: Huang Shijie <b32955 at freescale.com>
---
 Documentation/ABI/testing/sysfs-class-mtd |   10 ++++++++++
 1 files changed, 10 insertions(+), 0 deletions(-)

diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd
index 3105644..da112ab 100644
--- a/Documentation/ABI/testing/sysfs-class-mtd
+++ b/Documentation/ABI/testing/sysfs-class-mtd
@@ -173,3 +173,13 @@ Description:
 		This is generally applicable only to NAND flash devices with ECC
 		capability.  It is ignored on devices lacking ECC capability;
 		i.e., devices for which ecc_strength is zero.
+
+What:		/sys/class/mtd/mtdX/ecc_step_size
+Date:		May 2013
+KernelVersion:	3.10
+Contact:	linux-mtd at lists.infradead.org
+Description:
+		The size of each ECC step which is used for ECC.
+		Note that some devices will have multiple ecc steps within each
+		writesize region. See more in the ecc_strength above. This will
+		always be a non-negative integer.
-- 
1.7.1