UBI torture_peb() bad block detection problem

[Qiang Yu]

Hi guys,

I'm writing MTD driver for Allwinner A10 nand controller. Now there is
a problem with the UBI torture_peb() function. From the code and UBI
doc, a PEB will be treated as bad when read with bit-flip after erase.
But with SAMSUNG K9GBG08U0A flash chip, sometimes the bit-flip does
happen even after being erased.

My question is why make this a rule to detect bad block in
torture_peb()? A PEB won't have bit-flip when just being erased?

Regards,
Qiang