Distinguishing bitflips due to read-disturb or due to wear-out
Atlant Schmidt
aschmidt at dekaresearch.com
Mon Mar 19 08:02:23 EDT 2012
Shmulik:
> > The bigger issue is how to discern whether the degradation is
> > due to read-disturb (which can be recovered by erasing/reprogramming
> > the block) or the page physically wearing out (in which case it
> > needs to be retired).
>
> Question is, do we really need to distinguish between the two?
I'm not sure one can distinguish read-disturb
from wear-out or (as you suggest) that it's even
meaningful to try and do so. Read-disturb effects
increase as hot-carrier injection permanently shift
the threshold of each FET closer and closer to that
FET reporting "0", right?
Meanwhile, yes, if things have gotten so bad that
erasure (an attempt to tunnel all of the electrons
off the floating gate) still leaves that transistor
with enough negative charge in the gate region that
it is unable to report a "1", then that flash block
is, indeed, toast and (IMO) should never be accepted
for use again.
What I *THINK* UBI is missing is the keeping of
appropriate statistics on which PEBs have had what
history of "soft" failures. UBI always lives "in
the here and now" and makes its decisions on the
1 bit of data it has at the instant (the latest
operation on the PEB succeeded or failed). Instead,
UBI should know that (e.g.) PEB 1234 ended up giving
it problems in 14 out of last 16 writes to that PEB
and maybe that PEB isn't worth using right now based
on the fill-ratio of the entire flash chip.
Atlant
-----Original Message-----
From: linux-mtd-bounces at lists.infradead.org [mailto:linux-mtd-bounces at lists.infradead.org] On Behalf Of Shmulik Ladkani
Sent: Sunday, March 18, 2012 06:00
To: Peter Barada
Cc: linux-mtd at lists.infradead.org
Subject: Distinguishing bitflips due to read-disturb or due to wear-out
Quote from [1].
Started a new thread as this is off-topic.
[1]
http://lists.infradead.org/pipermail/linux-mtd/2012-March/040336.html
> The bigger issue is how to discern whether the degredation is due to
> read-disturb (which can be recovered by erasing/reprogramming the block)
> or the page physically wearing out (in which case it needs to be
> retired).
Question is, do we really need to distinguish between the two?
If there is a "dangerously high" number of bit errors, then scrubbing
should be performed.
If the reason for the bit errors was due to read-disturb, then those
error are gone after scrubbing (for now, until read-disturb affects
again).
If the reason was wear-out, then it is likely that high number of bit
errors will be evident, again. But if the block is totally worn-out,
shouldn't the device return an error status for the erase operation,
eventually? (and as such, the MTD software will retire the block)?
Regards
Shmulik
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