Spurious ECC errors with mtd_subpagetest (OMAP3, NAND)

[Orjan Friberg]

On 03/02/2012 05:17 PM, Orjan Friberg wrote:
> Hi,
>
> When running the mtd_subpagetest I'm seeing more or less spurious ECC
> corrections.  I.e., one round may show 4 corrections and the next will
> show 7, only some of which are the same as the previous 4.

FWIW

* I'm seeing the same behaviour (i.e. transient ECC errors) when doing 
nanddump on a partition.
* mtd_oobtest fails on "verify failed at <varying address>", and "read 
past end of device".


-- 
Orjan Friberg
FlatFrog Laboratories AB