[PATCH v2 0/2] Improved BB Scanning
karl.beldan at gmail.com
Thu Jul 22 15:44:45 EDT 2010
On Wed, Jul 21, 2010 at 11:49 AM, Artem Bityutskiy <dedekind1 at gmail.com> wrote:
> On Mon, 2010-07-19 at 12:32 -0700, Brian Norris wrote:
>> On 07/18/2010 09:38 AM, Artem Bityutskiy wrote:
>> > I did not _really_ review this, it the patches look good. How did you
>> > test them? Did you test on both large and small page NANDs?
>> I referenced 30+ data sheets (covering 100+ parts), and I tested a
>> selection of 10 different chips to varying degrees. Particularly, I
>> tested the creation of bad-block descriptors and basic BB scanning on
>> three parts:
>> ST NAND04GW3B2D, 2K page
>> ST NAND128W3A, 512B page
>> Samsung K9F1G08U0A, 2K page
>> To test these, I wrote some fake bad block markers to the flash (in OOB
>> bytes 1, 6, and elsewhere) to see if the scanning routine would detect
>> them properly. However, this method was somewhat limited because the
>> driver I am using has some bugs in its OOB write functionality.
> Sounds like you did a lot of work. I'll add this information to the
> patch description.
I haven't seen many nandsim feedback, though it allows precise test scenarios
and easy flash forensics.
Still, FWIW, I too laud the effort.
More information about the linux-mtd