[PATCH 2/2] MTD: Add nand_ecc test module
Akinobu Mita
akinobu.mita at gmail.com
Mon Oct 19 02:11:46 EDT 2009
This module tests NAND ECC functions.
The test is simple.
1. Create a 256 or 512 bytes block of data filled with random bytes (data)
2. Duplicate the data block and inject single bit error (error_data)
3. Try to correct error_data
4. Compare data and error_data
This test is added into new MTD test group called MTD NAND test
which requires MTD NAND device support.
Signed-off-by: Akinobu Mita <akinobu.mita at gmail.com>
Cc: David Woodhouse <dwmw2 at infradead.org>
Cc: linux-mtd at lists.infradead.org
Cc: Artem Bityutskiy <Artem.Bityutskiy at nokia.com>
---
drivers/mtd/Kconfig | 6 +++
drivers/mtd/tests/Makefile | 1 +
drivers/mtd/tests/nand_ecc-test.c | 88 +++++++++++++++++++++++++++++++++++++
3 files changed, 95 insertions(+), 0 deletions(-)
create mode 100644 drivers/mtd/tests/nand_ecc-test.c
diff --git a/drivers/mtd/Kconfig b/drivers/mtd/Kconfig
index ecf90f5..abe5c7f 100644
--- a/drivers/mtd/Kconfig
+++ b/drivers/mtd/Kconfig
@@ -33,6 +33,12 @@ config MTD_TESTS
should normally be compiled as kernel modules. The modules perform
various checks and verifications when loaded.
+config MTD_NAND_TESTS
+ tristate "MTD NAND tests support"
+ depends on MTD_TESTS && MTD_NAND
+ help
+ This option enables MTD tests which require NAND Device support.
+
config MTD_CONCAT
tristate "MTD concatenating support"
help
diff --git a/drivers/mtd/tests/Makefile b/drivers/mtd/tests/Makefile
index c1d5013..3994d5a 100644
--- a/drivers/mtd/tests/Makefile
+++ b/drivers/mtd/tests/Makefile
@@ -5,3 +5,4 @@ obj-$(CONFIG_MTD_TESTS) += mtd_speedtest.o
obj-$(CONFIG_MTD_TESTS) += mtd_stresstest.o
obj-$(CONFIG_MTD_TESTS) += mtd_subpagetest.o
obj-$(CONFIG_MTD_TESTS) += mtd_torturetest.o
+obj-$(CONFIG_MTD_NAND_TESTS) += nand_ecc-test.o
diff --git a/drivers/mtd/tests/nand_ecc-test.c b/drivers/mtd/tests/nand_ecc-test.c
new file mode 100644
index 0000000..54bbb4a
--- /dev/null
+++ b/drivers/mtd/tests/nand_ecc-test.c
@@ -0,0 +1,88 @@
+#include <linux/kernel.h>
+#include <linux/module.h>
+#include <linux/list.h>
+#include <linux/slab.h>
+#include <linux/random.h>
+#include <linux/string.h>
+#include <linux/bitops.h>
+#include <linux/jiffies.h>
+
+void inject_single_bit_error(void *data, size_t size)
+{
+ unsigned long offset = random32() % (size * BITS_PER_BYTE);
+
+ __change_bit(offset, data);
+}
+
+#if defined(CONFIG_MTD_NAND) || defined(CONFIG_MTD_NAND_MODULE)
+
+#include <linux/mtd/nand_ecc.h>
+
+static unsigned char data[512];
+static unsigned char error_data[512];
+
+static int nand_ecc_test(const size_t size)
+{
+ unsigned char code[3];
+ unsigned char error_code[3];
+ char testname[30];
+
+ BUG_ON(sizeof(data) < size);
+
+ sprintf(testname, "nand-ecc-%zu", size);
+
+ get_random_bytes(data, size);
+
+ memcpy(error_data, data, size);
+ inject_single_bit_error(error_data, size);
+
+ __nand_calculate_ecc(data, size, code);
+ __nand_calculate_ecc(error_data, size, error_code);
+ __nand_correct_data(error_data, code, error_code, size);
+
+ if (!memcmp(data, error_data, size)) {
+ printk(KERN_INFO "nand_ecc-test: ok - %s\n", testname);
+ return 0;
+ }
+
+ printk(KERN_ERR "nand_ecc-test: not ok - %s\n", testname);
+
+ printk(KERN_DEBUG "hexdump of data:\n");
+ print_hex_dump(KERN_DEBUG, "", DUMP_PREFIX_OFFSET, 16, 4,
+ data, size, false);
+ printk(KERN_DEBUG "hexdump of error data:\n");
+ print_hex_dump(KERN_DEBUG, "", DUMP_PREFIX_OFFSET, 16, 4,
+ error_data, size, false);
+
+ return -1;
+}
+
+#else
+
+static int nand_ecc_test(const size_t size)
+{
+ return 0;
+}
+
+#endif
+
+static int __init ecc_test_init(void)
+{
+ srandom32(jiffies);
+
+ nand_ecc_test(256);
+ nand_ecc_test(512);
+
+ return 0;
+}
+
+static void __exit ecc_test_exit(void)
+{
+}
+
+module_init(ecc_test_init);
+module_exit(ecc_test_exit);
+
+MODULE_DESCRIPTION("ECC test module");
+MODULE_AUTHOR("Akinobu Mita");
+MODULE_LICENSE("GPL");
--
1.5.4.3
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