word line disturbance

[Charles Manning]

I'm using the flash embedded in a AT91FR4042 (single chip ARM7-based micro + 
512kB flash + 256kB RAM).  The flash is essentially an AT49xV4096A.

This device has 4 sectors: 1x16kB "boot", 2x8kB "parameter" and 1x480kB 
"application". The datasheet/appnote warns that  reprogramming the boot can 
impact other sectors. Also, reprogramming the application area  can disturb 
the parameter areas.

At first I just blew this off as just a theoretical possibility, but found 
that these disturbances do occur on a regular basis (seen on 5 out of 5 proto 
devices) - particularly upgrading the application area corrupting the 
parameter areas.

-- Charles