[PATCH 1/2] pwm: samsung: Fix broken resume after putting per-channel data into driver data

[Marek Szyprowski]

PWMF_EXPORTED is misleadingly used as a bit numer in the pwm->flags, not
as a flag value, so the proper test for it must use test_bit() helper.
This fixes broken resume after putting per-channel data into driver data.

Fixes: e3fe982b2e4e ("pwm: samsung: Put per-channel data into driver data")
Signed-off-by: Marek Szyprowski <m.szyprowski at samsung.com>
---
 drivers/pwm/pwm-samsung.c | 2 +-
 1 file changed, 1 insertion(+), 1 deletion(-)

diff --git a/drivers/pwm/pwm-samsung.c b/drivers/pwm/pwm-samsung.c
index 568491ed6829..69d9f4577b34 100644
--- a/drivers/pwm/pwm-samsung.c
+++ b/drivers/pwm/pwm-samsung.c
@@ -631,7 +631,7 @@ static int pwm_samsung_resume(struct device *dev)
 		struct pwm_device *pwm = &chip->pwms[i];
 		struct samsung_pwm_channel *chan = &our_chip->channel[i];
 
-		if (!(pwm->flags & PWMF_REQUESTED))
+		if (!test_bit(PWMF_REQUESTED, &pwm->flags))
 			continue;
 
 		if (our_chip->variant.output_mask & BIT(i))
-- 
2.34.1