[PATCH] usb: dwc3 dwc3_exynos_probe() change goto labels to meaningful names

[Javier Martinez Canillas]

Hello Shuah,

On 01/11/2017 01:45 PM, Shuah Khan wrote:
> Change goto labels to meaningful names from a series of errNs.
> 
> Signed-off-by: Shuah Khan <shuahkh at osg.samsung.com>
> ---
>  drivers/usb/dwc3/dwc3-exynos.c | 22 +++++++++++-----------
>  1 file changed, 11 insertions(+), 11 deletions(-)
> 
> diff --git a/drivers/usb/dwc3/dwc3-exynos.c b/drivers/usb/dwc3/dwc3-exynos.c
> index f7421c2..ea50f74 100644
> --- a/drivers/usb/dwc3/dwc3-exynos.c
> +++ b/drivers/usb/dwc3/dwc3-exynos.c
> @@ -147,53 +147,53 @@ static int dwc3_exynos_probe(struct platform_device *pdev)
>  	exynos->vdd33 = devm_regulator_get(dev, "vdd33");
>  	if (IS_ERR(exynos->vdd33)) {
>  		ret = PTR_ERR(exynos->vdd33);
> -		goto err2;
> +		goto vdd33_err;
>  	}

I think it's better to use as labels what will be done in the error path
rather than what failed. IOW, "disable_axius_clk" or "disable_clks" are
more clear than vdd33_err for me, since can give you an idea of what will
happen in the error path.

But I don't have a strong opinion and your naming is an improvement over
the current one, so:

Reviewed-by: Javier Martinez Canillas <javier at osg.samsung.com>

Best regards,
-- 
Javier Martinez Canillas
Open Source Group
Samsung Research America