[PATCH V4 1/3] OPP: Redefine bindings to overcome shortcomings

Viresh Kumar viresh.kumar at linaro.org
Mon May 11 22:20:33 PDT 2015

On 10-05-15, 20:07, Nishanth Menon wrote:
> just one minor concern being in the SoC end of the world :). In most
> times, the current consumption for a specific OPP varies depending on
> the specific location in the process node the die is -> this is even
> true among a single lot of wafers as well. some SoC vendors use hot,
> nominal and cold terminology to indicate the characteristics of the
> specific sample.
> it might help state which sample end of the spectrum we are talking
> about here. reason being: if I put in values based on my board
> measurement, the results may not be similar to what someone else's
> sample be. Depending on technology, speed binning strategy used by the
> vendor, temperature and few other characteristics, these numbers could
> be widely divergent.

I don't have any clue about this.. :(

@Mark/stephen: Any inputs ?

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